Acetone ≥99.5% (by GC, corrected for water content), CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
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Danger
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9005-03EA
0
EUR
9005-03
9005-05
Acetone ≥99.5% (by GC, corrected for water content), CMOS for microelectronic, J.T.Baker®
Acetone
Formula:
CH₃COCH₃ Boiling Pt: 56,2 °C (1013 hPa) Melting Pt: –95,4 °C Density: 0,792 g/cm³ (20 °C) Flash Pt: <–20 °C (closed cup) Storage Temperature: Ambient |
MDL Number:
MFCD00008765 CAS Number: 67-64-1 EINECS: 200-662-2 UN: 1090 ADR: 3,II REACH: 01-2119471330-49 Merck Index: 13,00067 |
Specification Test Results
For Microelectronic Use |
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Assay ((CH₃)₂CO) (by GC, Corrected for Water) | ≥99.5% |
Colour (APHA) | ≤10 |
Residue after Evaporation | ≤5 ppm |
Titrable Acid (µeq/g) | ≤0.3 |
Titrable Base (µeq/g) | ≤0.5 |
Water (H₂O) | ≤0.5% |
Solubility in H₂O | Passes Test |
Chloride (Cl) | ≤0.2 ppm |
Phosphate (PO₄) | ≤0.05 ppm |
Trace Impurities - Aluminum (Al) | ≤50.0 ppb |
Arsenic and Antimony (as As) | ≤5.0 ppb |
Trace Impurities - Barium (Ba) | ≤20.0 ppb |
Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤20.0 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
Trace Impurities - Calcium (Ca) | ≤25.0 ppb |
Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤10.0 ppb |
Trace Impurities - Gold (Au) | ≤20 ppb |
Trace Impurities - Iron (Fe) | ≤20.0 ppb |
Trace Impurities - Lead (Pb) | ≤10.0 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤20 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
Trace Impurities - Niobium (Nb) | ≤50.0 ppb |
Trace Impurities - Potassium (K) | ≤10.0 ppb |
Trace Impurities - Silicon (Si) | ≤50 ppb |
Trace Impurities - Silver (Ag) | ≤10.0 ppb |
Trace Impurities - Sodium (Na) | ≤10.0 ppb |
Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤50.0 ppb |
Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤20.0 ppb |
Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
Trace Impurities - Vanadium (V) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
Particle Count - 0.5 µm and Greater (Rion KS42AF) | ≤100 par/ml |
Particle Count - 1.0 µm and Greater (Rion KS42AF) | ≤8 par/ml |
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