Sieve standards, NIST and NPL traceable

Supplier: WHITEHOUSE

SS399 SS400 SS401 SS402 SS403 SS404 SS405 SS406 SS407 SS408 SS409 SS410 SS411 SS412 SS391 SS392 SS393 SS394 SS395 SS396 SS397 SS398 SS413 SS414 SS415 SS416 SS417 SS418 SS419 SS420 SS305 SS300
510-0174EA 586 EUR
510-0174 510-0175 510-0176 510-0177 510-0178 510-0179 510-0180 510-0181 510-0182 510-0183 510-0184 510-0185 510-0186 510-0187 510-0166 510-0167 510-0168 510-0169 510-0170 510-0171 510-0172 510-0173 510-0377 510-0378 510-0379 510-0380 510-0381 510-0382 510-0383 510-0384 510-2090 510-2089
Sieve standards, NIST and NPL traceable
Standards Particle Size Standards

Unique microsphere method of sieve calibration applicable to all sieves from 20 to 3350 µm.


  • Method analyses over 80% of the sieve surface
  • Results independent of sieve shaking method
  • No need to send sieves away for calibration
  • Typical calibration time of about 1 minute
  • Single-use bottles remove operator bias


Accuracy and repeatability better than 1 µm.


Certifications: Mean aperture size traceable to NIST and NPL.

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