Sieve standards, NIST and NPL traceable
Supplier: WHITEHOUSE
SS399
SS400
SS401
SS402
SS403
SS404
SS405
SS406
SS407
SS408
SS409
SS410
SS411
SS412
SS391
SS392
SS393
SS394
SS395
SS396
SS397
SS398
SS413
SS414
SS415
SS416
SS417
SS418
SS419
SS420
SS305
SS300
510-0174EA
586
EUR
510-0174
510-0175
510-0176
510-0177
510-0178
510-0179
510-0180
510-0181
510-0182
510-0183
510-0184
510-0185
510-0186
510-0187
510-0166
510-0167
510-0168
510-0169
510-0170
510-0171
510-0172
510-0173
510-0377
510-0378
510-0379
510-0380
510-0381
510-0382
510-0383
510-0384
510-2090
510-2089
Sieve standards, NIST and NPL traceable
Standards
Particle Size Standards
Unique microsphere method of sieve calibration applicable to all sieves from 20 to 3350 µm.
- Method analyses over 80% of the sieve surface
- Results independent of sieve shaking method
- No need to send sieves away for calibration
- Typical calibration time of about 1 minute
- Single-use bottles remove operator bias
Accuracy and repeatability better than 1 µm.
Certifications: Mean aperture size traceable to NIST and NPL.
Learn more
About VWR
Avantor is a vertically integrated, global supplier of discovery-to-delivery solutions for...